利用高分辨X射线衍射研究磷酸二氢钾晶体晶格应变应力  

Study of KDP crystal lattice strain and stress by high resolution X-ray diffraction

作　　者：孙云[1] 王圣来[1] 顾庆天[1] 许心光[1] 丁建旭[1] 刘文洁[1] 刘光霞[1] 朱胜军[1] 

机构地区：[1]山东大学晶体材料国家重点实验室,济南250100

出　　处：《物理学报》2012年第21期15-20,共6页Acta Physica Sinica

基　　金：国家自然科学基金(批准号:50721002)资助的课题~~

摘　　要：采用高分辨X射线衍射技术对大尺寸磷酸二氢钾(KDP)晶体的晶格应变进行了测量,并定量分析了其晶格应力.探讨出KDP晶体容易沿着[001]方向发生开裂,与实际工作中的开裂现象相符合;进一步归纳总结了晶体生长过程中引入内应力而导致晶体开裂的主要因素.研究结果为提出相应的晶体防裂措施提供了重要的理论基础.The lattice strain of large-scale KDP crystal is characterized by using high resolution X-ray diffraction technique, and the lattice stress is analysed quantitatively in detail. The results indicate that KDP crystal may cleave easily along the [001] direction, which corresponds to the cracking phenomenon in the practical work. The major factors of introducing the internal stress and causing crack in the crystal growth process are summarized. Those conclusions provide important theoretical basis for proposing crack control measures of the large-scale KDP crystals.

关 键 词：高分辨X射线衍射 晶格应变 应力 开裂 

分 类 号：O614.111[理学—无机化学] O657.34[理学—化学]