采用全局互连线随机模型的硅物理不可克隆函数的设计  

Designof Silicon Physical Unclonable Functions using Global Interconnect Stochastic Model

作　　者：吴志安[1] 段成华[1] 

机构地区：[1]中国科学院研究生院信息科学与工程学院,北京100049

出　　处：《微电子学与计算机》2012年第12期36-42,共7页Microelectronics & Computer

摘　　要：物理不可克隆函数(PUF)是一种新颖的从复杂物理系统中提取"秘密"的技术方法,有望在移动设备身份鉴别、密钥的生成和存储等诸多领域得到广泛应用.现有的硅PUF电路仅考虑了片上逻辑器件延时,而忽视了已经作为时序模型主导因素的全局互连延时,不符合物理电路的实际.本文在PUF的构造中考虑到IC加工工艺的变化性并结合互连延时模型,提出了一种新型的PUF电路.仿真实验是在Synopsys Hspice C-2010模拟设计平台上完成的,测量了PUF电路的片间差异和片内差异参数,评估了128位的PUF电路的性能.实验结果表明所设计的PUF电路是可行的,有望应用于移动计算身份鉴别和核心芯片防护.Physical unclonable function （PUF） is a novel method to extract ＂secret＂ from complex physical systems. It is expected to be widely used in many fields such as mobile device authentication, key generation and storage. But existing silicon PUF circuits consider only on-chip logic device delay and ignore global interconnect delay that has already become the dominant factor of timing model, thus behaving differently with corresponding physical circuits. In this paper, a new silicon PUF circuit is proposed by considering state-of-the-art IC manufacturing process variations and incorporating global interconnect delay model into PUF building. Experiments are conducted on Synopsys Hspice C-2010 analog design platform, on which PUF circuits＇ parameters of inter-chip and intra-chip variations are measured for evaluating the performance of a 128-bit PUF. Experiment results show that this PUF circuit is effective and is expected to support applications of identity authentication in mobile computing and of protecting core chips from intrusive attack.

关 键 词：物理不可克隆函数 器件延时 互连延时 片间差异 片内差异 

分 类 号：TN47[电子电信—微电子学与固体电子学]