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作 者:曹开江[1] 徐跃 吴广宁[1] 徐慧慧[1] 张依强[1] 罗杨[1]
机构地区:[1]西南交通大学电气工程学院,四川成都610031 [2]青岛四方机车车辆股份有限公司,山东青岛266111
出 处:《西南交通大学学报》2012年第6期1009-1014,共6页Journal of Southwest Jiaotong University
基 金:国家自然科学基金资助项目(51177136)
摘 要:为探讨方波脉冲电压下电磁线的绝缘老化及破坏机理,采用高频高压脉冲绝缘寿命试验装置和局部放电测试系统,研究了不同频率和上升时间下的电磁线的绝缘寿命、局部放电特性及其影响因素,得到了方波脉冲电压下频率的绝缘老化寿命模型和上升时间的绝缘老化寿命模型.研究结果表明:随着脉冲频率的升高和上升时间的缩短,局部放电活动增强,电磁线寿命降低;上升时间的绝缘老化寿命模型和频率的绝缘老化寿命模型的相关系数分别为0.93和0.95.In order to investigate the aging and failure mechanism of insulation under square pulse voltage, an insulation life characteristic device for high frequency and high impulse voltage and a partial discharge (PD) test system were adopted. PD activity and its impact factors as well as life characteristic of magnet wires under different frequencies and rise times were investigated, and insulation aging life models for different frequencies and rise times under square pulse voltage were obtained. The research result indicates that with increasing of frequency and shortening of square pulse rise time, the PD activity becomes severe and the life of magnet wires decreases. Correlation coefficients for the life models of different rise times and frequencies are 0.93 and 0.95, respectively.
分 类 号:TM835[电气工程—高电压与绝缘技术] TM851
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