计量光栅可变步长实时扫描定位FPGA实现  

FPGA Implementation of Realtime Location at Variable Scanning Step Using Metrological Grating

作　　者：卢明腾[1] 曹益平[1] 

机构地区：[1]四川大学

出　　处：《工具技术》2013年第1期54-57,共4页Tool Engineering

基　　金：国家863高技术研究发展计划(2007AA01Z333);国家重大专项(2009ZX02204-008);四川省学术和技术带头人培养基金(07GRC-01)

摘　　要：设计一种用现场可编程逻辑门阵列FPGA实现光栅可变步长扫描实时定位控制的方法;实现在扫描台连续运动的过程中,实时同步定位触发控制。用D触发器实现对光栅信号边沿提取进而实现光栅信号细分辨向电路,在此基础上实现可变步长实时扫描控制的方案。以Verilog HDL硬件描述语言为平台实现了该电路方案。该系统可用于扫描测量控制,可变步长定位控制。Based on FPGA（ Field Programmable Gate Array）, a methord is designed to implement scanning measure- ment and location at alterable step by using grating. The method achieves it that to instantaneously trigger control signal during the continuous motion of the scanner. A circuit design is proposed to extract the edge of the grating signal and a- chieve direction discerning and fold - frequency muhiplicationhy using D -flip flop, and based on this to achieve the en- tire plan of alterable step （ bigger step which is several times of the shortest step ） scanning control. The system is de- scribed by Verilog HDL（ Hardware Discription Language）. This system can be used in the field of scanning measurement and alterable step location control. Kcywords ： grating ; moire fringe; variable step ; Verilog ; FPGA

关 键 词：光栅 莫尔条纹 变步长 VERILOG FPGA 

分 类 号：TG806[金属学及工艺—公差测量技术]