纳米级集成电路的软错误问题及其对策  

Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits

作　　者：张民选[1] 孙岩[1] 宋超[1] 

机构地区：[1]国防科学技术大学计算机学院,长沙410073

出　　处：《上海交通大学学报》2013年第1期1-6,12,共7页Journal of Shanghai Jiaotong University

基　　金：国家自然科学基金项目(60970036)

摘　　要：介绍了纳米级集成电路中软错误的发生机制、发展趋势以及评估技术,概括了软件、电路和体系结构以及工艺器件级软错误的缓解对策,并针对软错误问题相关研究的发展提出几点建议.This paper described the mechanism, trends and evaluation ter scale integrated circuits. For solving the soft error problems, the ures across the software level, circuit and architecture-level as well as suggestions on the development of related studies on soft error proble techniques of soft errors in nanome- paper summed up the countermeas- process device-level. At last, some ms were put forward.

关 键 词：软错误 集成电路 可靠性 

分 类 号：TN47[电子电信—微电子学与固体电子学]