基于遗传算法的PCB互连测试矢量集优化初探  

On the Preliminary Research of Test Sets Optimization By Genetic Algorithm in the Test Vectors Generation of PCB Interconnect

作　　者：卢静[1] 周娅[1] 郭学仁 

机构地区：[1]桂林电子工业学院计算机系,广西桂林541004

出　　处：《桂林电子工业学院学报》2000年第3期41-44,共4页Journal of Guilin Institute of Electronic Technology

摘　　要：测试矢量生成是 PCB互连测试的关键环节 ,它对整个 PCB测试过程有着重要意义。本文就基于遗传算法的 PCB互连测试矢量集优化讨论了编码策略、目标函数等问题 ,提出了几种遗传算子的改进方案 ,得出一种高效的遗传算法。实验数据证明该方法是有效的。The test vectors generation is an important problem in the test of PCB interconnect.In the paper,a pratical model,which applies genetic algorithms as a searching policy to generate the test vectors of PCB interconnect test,is mainly proposed.According to the characteristic of PCB and MCM,the coding strategy,the evaluation of the functional construction and several genetic algorithms are defined and in detail.Finally,a preliminary research work is done.

关 键 词：遗传算法 VLSI 优化 PCB 互连 测试矢量集 

分 类 号：TN470.6[电子电信—微电子学与固体电子学]