探测微小空间碎片的MOS电容传感器设计研究  

Study of On-board Micro Space Debris MOS Capacitor-type Detector

作　　者：何正文[1] 张明磊[1] 向宏文[1] 吴中祥[1] 王金延[2] 

机构地区：[1]北京空间飞行器总体设计部,北京100094 [2]北京大学微电子研究所,北京100871

出　　处：《航天器工程》2013年第1期87-92,共6页Spacecraft Engineering

摘　　要：获得在轨微小碎片环境数据,是建立、检验和完善微小碎片环境模型不可缺少的手段。国内空间碎片研究工作的深入开展,须要研制适合搭载到航天器上的微小碎片探测器,以完成轨道空间的微小碎片的质量、尺寸、速度及飞行方向等参数的测量。微小碎片撞击到金属-氧化物-半导体(MOS)电容传感器,会导致传感器放电和充电,通过检测充电过程的电脉冲信号,记录微小空间碎片撞击事件,从而获得微小空间碎片通量。文章就探测微小碎片的MOS电容传感器设计及其地面高速粒子撞击模拟试验进行了研究,并验证其探测微小空间碎片的可行性。The on-board acquiring data of micro-debris is a necessary way by which the developing space debris models are verified and improved. To meet the requirement of space debris research, it is indispensable to develop on-board micro space debris detectors which are fit for spacecraft. On-board micro space debris detectors will measure the mass, velocity and direction of micro-deb- ris. The charged metal-oxide-silicon （MOS） capacitor will be discharged and recharged when a micro-debris impacts the MOS capacitor sensor. The impact event can be recorded by measuring the charging signal, then flux of micro space debris can be obtained by the impact events. The systemic scheme of MOS capacitor sensor for a micro space debris detector is designed in this paper. The main contents include design of capacitor sensors, impacting sensors test by hyperve- locity particles accelerator. The results show that the design method of MOS capacitor sensor is reasonable and feasible.

关 键 词：微小空间碎片 MOS电容 撞击 

分 类 号：V447[航空宇航科学与技术—飞行器设计]