电子元器件加速寿命试验的挑战与对策  

Challenges and Solutions to Accelerated Life Test of Electronic Components

作　　者：许斌[1] 

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《微电子学》2013年第1期148-152,共5页Microelectronics

基　　金：模拟集成电路重点实验室基金资助项目(9140C090406120C09037);民用航空预先研究资助项目(YG0901-3)

摘　　要：加速寿命试验是评价和提升高可靠长寿命电子元器件长期工作可靠性的有效方法。详细介绍了电子元器件加速寿命试验方案设计和实施中需要考虑的主要问题;通过一个实例,说明了不充分的加速寿命试验最终可能在现场应用中引起严重的事故;探讨了如何基于上述挑战,改进加速寿命试验设计的措施,以期促进我国电子元器件加速寿命试验技术的发展。Accelerated life testing（ALT） is an effective way to evaluate and improve long-term reliability of electronic components in operation.Major challenges to be considered when planning and implementing ALT of electronic components were dealt with.A case study showed that inadequate ALT could result in serious failures in product application.In order to solve those challenges,measures to improve ALT plan were discussed,which might help to promote the development of ALT of electronic components and be useful to research and production of high-reliability electronic components.

关 键 词：高可靠性 电子元器件 加速寿命试验 可靠性评价 

分 类 号：TN406[电子电信—微电子学与固体电子学]