基于片外信号源的SoC低成本测试解决方案  

Introduction of Low Cost SoC Testing Scheme Based on Off-chip Signal Source

作　　者：钟伟宏 刘炎华[2] 孙玲[2,3] 

机构地区：[1]南通富士通微电子股份有限公司,江苏南通226019 [2]南通大学江苏省专用集成电路设计重点实验室,江苏南通226019 [3]计算机体系结构国家重点实验室中国科学院计算技术研究所,北京100190

出　　处：《电子与封装》2012年第11期17-19,31,共4页Electronics & Packaging

基　　金：教育部科学技术研究重点项目(No.210080);江苏省专用集成电路设计重点实验室开放课题(JSICK0801);计算机体系结构国家重点实验室开发课题(ICT-ARCH201001)

摘　　要：随着SoC芯片集成度和复杂度的不断提高,其测试变得越来越复杂,测试成本也越来越高,如何降低过高的测试成本也逐渐成为研究的热点。卫星数字电视信道接收芯片作为机顶盒关键芯片之一,对低成本测试的要求也越来越迫切。文章针对某卫星数字电视信道接收芯片,通过分析该芯片的内部模块功能,采用片外信号源方法设计该芯片的低成本测试方案,并在自动测试系统T6575上实现。实际生产结果表明,该方法能极大降低芯片测试成本。With the continuously increasing in chip complexity and transistor density, the cost of chip testing is also increasing and even exceeds the cost of design and manufacturing. How to decrease the testing cost has become hot research area. Channel receiver chip of satellite digital television, as one of key components in set-top box, has growing requirement for the low cost testing. In this paper, a low cost testing scheme based on off-chip signal source is proposed by analysing the internal module, working principle and characteristics of the chip, which is implemented on ATE T6575. The results of production demonstrate that the proposed testing scheme can obviously reduce the testing cost of the chip.

关 键 词：片上系统 片外信号源 低成本 自动测试系统 

分 类 号：TP302.8[自动化与计算机技术—计算机系统结构]