用于电子光学系统像差分析的自动微分技术及其在Visual C++平台上的软件实现  

Automatic differentiation technique for aberration analysis of electronic optic systems with implementation in Visual C++ environment

作　　者：王莉萍[1] 程彬杰[1] 唐天同[1] 蔡杰[1] 

机构地区：[1]西安交通大学光电子与物理电子工程系,西安710049

出　　处：《电子显微学报》1999年第6期644-651,共8页Journal of Chinese Electron Microscopy Society

摘　　要：本文研究计算机数值计算与分析领域内的一个完全崭新的技术——自动微分技术。自动微分技术为带电粒子光学中的任意高阶像差分析与校正提供了一个很有效的工具。我们研究了自动微分功能利用面向对象的编程技术的实现，并在ＶＣ＋ ＋ 环境中编制了一个软件包，用于带电粒子光学系统中的粒子轨迹追踪及像差分析。用此软件模拟了电子在二维偏转电场中的轨迹，其结果与解析解完全一致，可达到机器精度。A new technique in computer numerical analysis,Automatic Differentiation was studied.It presents an effective and elegant tool for the analysis and correction of arbitrary order aberrations of charged particle optical systems.Object oriented programming was studied for implementation of automatic differentiation,and an AD software was developed in Visual C++ environment.The deflection of electrons in 2D electric fields was simulated. The results show perfect agreement with analytic solutions,with accuracy limited only by the computer.

关 键 词：自动微分 带电粒子光学 电子光学系统 像差 

分 类 号：O463.1[机械工程—光学工程]