一种基于最小均方差算法的散斑图像微位移测量系统  

A Speckle Pattern Micro-Displacement Measurement System Based on Minimum-Mean-Square-Error Algorithm

作　　者：刘大亮[1] 刘忠[1] 王庆[1] 樊莉[1] 张毅[1] 孙国辉[1] 白冰[1] 

机构地区：[1]首都航天机械公司,北京100076

出　　处：《机械管理开发》2012年第2期16-17,19,共3页Mechanical Management and Development

摘　　要：为了满足微位移量的实时、非接触测量的需要,研制了基于散斑图像的一种嵌入式微位移测量系统,它是基于最小均方差法和DSP处理器(TMS320DM642)设计的。重点阐述软件系统和实验系统的设计与实现方法,并在不同运动速度和表面粗糙度的条件下,对其测量系统进行实验和数据分析。实验结果表明,该测量系统是可行有效的。In order to satisfy the need of real-time and non-contact measurement of micro-displacement, an embedded micro-displacement measurement system is developed based on the speckle pattern. The algorithm Minimum-Mean-Square-Error and the DSP micro-processor （TMS320DM642） were picked out to design and implement the measurement system. In addition, the methods to design and implement the software as well as the experimental system were described emphatically. Finally, the testing experiments of the measurement system and the data analysis were implemented using sorts of testing specimens, such as the diverse velocity and the different surface roughness. The experiment results show that the developed measurement system is feasible and effective.

关 键 词：微位移测量 散斑图像 嵌入式系统 

分 类 号：TP31[自动化与计算机技术—计算机软件与理论]