CdS量子点敏化ZnO薄膜的制备及其性能研究  被引量:2

Preparation and Properties of CdS Quantum Dot Sensitized ZnO Thin Films

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作  者:王旭[1] 张海明[1] 李菁[1] 

机构地区:[1]天津工业大学理学院,天津300387

出  处:《人工晶体学报》2013年第3期466-469,共4页Journal of Synthetic Crystals

基  金:国家自然科学基金(61274064)资助项目

摘  要:本文以Zn(CH3COO)2·2H2O、CdCl2和硫脲的水溶液分别为前驱体,采用超声喷雾热解法在ITO导电玻璃上成功的制备了CdS量子点敏化ZnO薄膜(ZnO∶CdS)。通过扫描电镜(SEM),X射线衍射(XRD),光致发光(PL)谱和吸收光谱对CdS量子点敏化ZnO薄膜形貌,结构和光学性能进行了研究。SEM图表明CdS量子点已成功沉积到ZnO薄膜上,量子点呈颗粒状,直径约71 nm。XRD结果显示,除观察到原有的ZnO特征峰外,在2θ=30.3°处有一明显的特征峰,对应着CdS的(111)晶面。PL谱图表明在325 nm的光激发下,CdS量子点敏化ZnO薄膜在400 nm处有一较强的紫外发射峰,在500~700 nm处有一个较宽的黄绿发射带。吸收光谱表明,CdS量子点敏化后ZnO薄膜在可见光区的吸收边为586nm。ZnO: CdS thin films were deposited on the ITO glass substrate by the ultrasonic spray pyrolysis (USP), using zinc acetate, cadmium chloride and thiocarbamide solution as precursor. The morphologies, crystal structures and optical properties of ZnO: CdS thin films were investigated by scanning electro microscopy (SEM), X-ray diffraction (XRD), photoluminescence(PL) and absorption spectrum. The SEM results indicated that CdS had been sensitized to ZnO film and CdS quantum dots are granular, diameters about 71 nm. The XRD patterns revealed that in addition to three characteristic peaks of ZnO can be observed, there is a new characteristic peak arise at the angle of 20 = 30.3°, corresponding to the (111) orientation of CdS crystal. The PL spectra of ZnO: CdS thin films show that ZnO: CdS thin films have a stronger UV emission peak at g00 nm and a wider green-yellow light emission band from 500-700 nm with excitation wavelength at 325 nm. UV-Vis absorbtion spectra results indicated that the absorbtion edge of ZnO: CdS thin films is 586 nm.

关 键 词:超声喷雾法 CDS量子点 ZNO薄膜 光学性能 

分 类 号:O484[理学—固体物理]

 

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