AQL、LTPD以及“零缺陷”三种抽样检验的比较  

A Brief Contrast of AQL,LTPD and Zero Defect Sampling for Inspection

作　　者：凌勇[1] 涂继云[1] 

机构地区：[1]中国电子科技集团公司第58研究所,江苏无锡214035

出　　处：《电子与封装》2013年第4期41-45,共5页Electronics & Packaging

摘　　要：抽样检验按照检验值的属性可以划分为计量抽样检验和计数抽样检验,而计数抽样检验又包括一次、二次以及多次抽样方案。文章主要介绍了计数型抽样检验中一次抽样方案的基本概念、抽样原理、表征参数、OC函数、OC曲线以及抽样方案辨别力指标。在此基础上,重点介绍了AQL抽样、LDPT抽样以及"零缺陷"抽样三种抽样检验方法的基本构架和检验流程。通过对三种抽样检验方法的分析对比,零缺陷抽样凭借其抽样方法简便、抽样方案经济、质量理念先进的特点,已经逐渐成为现代企业质量检验管理的潮流所向。Sampling inspection can be divided into inspection by variables and inspection by attributes according to the test value of sample, which include single, double and multiple sampling inspection. This paper mainly introduces basic concept, theory of sampling, characterization parameters, OC function, OC curve and samling disciminability index. On this basis, the author describes the structure and procedure of AQL, LTPD and zero defect sampling for inspection. Through the constrast analysis of the three sampling plans, zero defect sampling plan has become to be gradually and widely used by modem enterprises for its simple sampling method,low-cost sampling scheme and advandced concept of quality.

关 键 词：计数抽样检验 OC函数 AQL LTPD 零缺陷 

分 类 号：TN307[电子电信—物理电子学]