DA器件的瞬态效应研究  

Research on Single Event Transient of Digital to Analog Converter

作　　者：陈莉明[1] 范隆[1] 岳素格[1] 郑宏超[1] 董攀[1] 马建华[1] 杜守刚[1] 

机构地区：[1]北京微电子技术研究所,北京100076

出　　处：《微电子学与计算机》2013年第6期105-108,共4页Microelectronics & Computer

摘　　要：主要对国内某款抗辐射加固DA器件进行了单粒子瞬态效应的试验研究.被测器件在加速器上采用不同的粒子进行辐照,同时在真空罐外利用一款高速示波器对DA器件的输出端进行监测,一旦发现瞬态脉冲即捕获并保存.试验发现随着辐照粒子LET的升高,DA器件的瞬态效应越明显,发生的次数也越多,产生的瞬态脉冲的脉宽也不断增大.This paper mainly studies~ single event transient （SET） of a digital to analog converter produced in China. The tested device in the paper was irradiated with different particles, and the output of the DUT was connected to an oscilloscope. If a SET occurs, the oscilloscope would capture it and save its data. The test results show that with increasing LET of particles, the SET is more obvious, the times of SET is larger and the pulse width of SET becomes wider.

关 键 词：DA 示波器 单粒子瞬态 脉宽 

分 类 号：TP302.8[自动化与计算机技术—计算机系统结构]