基于STM32的Flash存储器坏块自动检测  

Auto Detection of Invalid Block of Flash Memory Based on STM32

作　　者：张亚辉[1] 马胜前[1] 

机构地区：[1]西北师范大学物理与电子工程学院,兰州730070

出　　处：《计算机系统应用》2013年第6期209-211,215,共4页Computer Systems & Applications

基　　金：国家自然科学基金(61162017);甘肃省教育厅研究生导师项目(1101-03)

摘　　要：针对Nand Flash存储器存在坏块的问题,提出一种基于STM32的Flash存储器坏块自动检测方法,通过STM32内部可变静态存储控制器,发出相应的数据、地址、控制信号,在不增加外部器件的情况下,快速访问Flash存储器,并给出了部分硬件电路和C语言编写的程序代码.该设计已成功实现自动检测Flash坏块的功能;操作简单、检测速度快、准确率高;并能读取Flash的ID号检测Flash性能,同时能够存储和读取2GB数据.According to Nand Flash memory bad block problem, this paper proposed a automatic check scheme to deal with bad block based on STM32. Without increasing the external device, through its internal flexible static memory controller, sends the corresponding data, address, control signals, to rapid access Flash memory. Its part circuit schematic diagram and C language program code was introduced. The design has been successfully realized the function of automatic checking the invalid block finally, and has the advantages of simple operation, fast detection speed, high accuracy rate, and can read the ID number of Flash to get the performance of the memory. And the design also can write and read 2GB data.

关 键 词：NAND FLASH 自动检测 STM32 可变静态存储控制器 串口通讯 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]