各向异性晶体的平板负折射成像研究  

Negative Refraction and Imaging Properties of Uniaxial Crystal Slabs

作　　者：杜银霄[1] 张又林[1] 麻华丽[1] 袁庆新[1] 徐培[1] 

机构地区：[1]郑州航空工业管理学院数理系,河南郑州450015

出　　处：《光学学报》2013年第6期215-221,共7页Acta Optica Sinica

基　　金：国家自然科学基金(51002143;51072184;61274012);河南省高等学校青年骨干教师资助计划(2011GGJS-140);河南省教育厅自然科学基金(2010B140015)资助课题

摘　　要：利用折射率椭球理论研究了各向异性晶体的平板负折射成像。研究结果表明:单轴晶体的负折射现象是由晶体的光学各向异性所引起的,属于单轴晶体的本质特性;单轴晶体的切角和双折射率是产生负折射的关键因素;各向异性晶体在一定的前提条件下可以实现平板负折射二次成像。最后通过钒酸钇(YVO4)和方解石(CaCO3)晶体对这套理论进行了实验验证。Negative refraction and imaging properties of uniaxial crystal slabs are investigated by the refractive index ellipsoid analyses. It is found that the concept of negative refraction can be extended to be an intrinsic property of all uinaxial crystals. The negative refraction effect of uinaxial crystals is mainly due to the anisotropic refractive index. The angular range for incident light to yield negative refraction attains its maximum which only depends on the difference of two refractive indices and the orientation of the crystals with their optic axes at a certain angle to the normal of the light incoming surface. The negative refraction imaging of uniaxial crystal slabs is restricted within some special conditions. These conclusions are verified by the experiments on positive uniaxial crystal YVO4 and negative unaxial crystal CaCO3.

关 键 词：物理光学 晶体光学 负折射成像 折射率椭球理论 负折射 各向异性 

分 类 号：O435.1[机械工程—光学工程]