HgCdTe薄膜材料组分分布对器件响应光谱的影响  

Effect of composition distribution in the HgCdTe film on spectral response of device

作　　者：崔宝双[1] 魏彦锋[1] 孙权志[1] 杨建荣[1] 

机构地区：[1]中国科学院上海技术物理研究所红外成像材料与器件重点实验室,上海200083

出　　处：《红外与毫米波学报》2013年第3期225-230,共6页Journal of Infrared and Millimeter Waves

基　　金：国家自然科学基金(60876012)~~

摘　　要：研究了HgCdTe液相外延薄膜的纵向组分分布对探测器响应光谱的影响.提出了一种计算HgCdTe红外探测器响应光谱的模型,模型中综合考虑了薄膜的实际组分分布以及光在器件各层结构中的相干、非相干传输.计算结果表明,在探测器的光吸收区,HgCdTe液相外延薄膜的组分梯度及其产生的内建电场可以显著地提高器件的响应率.通过与实验数据进行比较,验证了模型的适用性.The effect of LPE HgCdTe longitudinal composition distribution on device＇ s spectral response was studied. A new model was proposed to calculate the spectral response of HgCdTe IR detector. This model considered the real com- position distribution in HgCdTe film. The coherent and incoherent light transmission among the device were also includ- ed. The calculated result indicates that the composition gradient of LPE HgCdTe film and the built-in electric field can evidently improve the response of the device. The calculated result agreed with the measured data, and proved the accu- racy of the model.

关 键 词：HGCDTE红外探测器 纵向组分分布 响应光谱 光传输模型 

分 类 号：TN214[电子电信—物理电子学]