基于BIST的SRAM型FPGA故障测试  

Fault Test to SRAM-Based FPGAs with Built-in Self-Test Method

作　　者：杨会平[1,2] 王晓鹏[1] 宋庆恒[1] 

机构地区：[1]怀化学院 物理与信息工程系,湖南怀化418000 [2]电子科技大学 自动化工程学院,四川成都611731

出　　处：《测控技术》2013年第6期13-16,共4页Measurement & Control Technology

基　　金：湖南省教育厅科学研究项目(10C1058)

摘　　要：从生产者角度对FPGA芯片测试技术进行深入而全面的研究,是保证制造出高可靠性芯片的一个重要前提。由于FPGA具有可重复编程性,该方法通过编程将FPGA内部资源划分为多个内建自测试(BIST,built in self test)模块,然后多次配置改换每个BIST模块中各个组成部分的角色和测试路径,进而达到对FPGA内部资源完全测试的目的。由于给出的方法是将内部资源作为一个整体来测试,所以FPGA的可编程逻辑资源和互连资源的测试问题可同时进行,继而有效地减少编程难度和测试时间。最后的实验结果表明该方法的有效性。For producers, an in-depth and comprehensive study on the FPGA testing technidogy is an important prerequisite to ensure the successful manufacture of high reliability chip. Since FPGA can be reprogrammed, this method can divide the FPGA internal resources into several BIST（ built-in self test） modules via program- ming, then change the role and test path of the various components in each BIST module via several configura- tions, the complete test for the internal resources of FPGA can be reached. This method makes the internal re- sources of FPGA as a whole to test, so the test for FPGA configurable logic blocks and interconnect resources can be carried out simultaneously, and then the difficulties of programming and testing time can be effectively reduced. The experimental results indicate that this method is effective.

关 键 词：可测性设计 故障诊断 BIST 互连资源 可编程逻辑资源 

分 类 号：TN710[电子电信—电路与系统]