星载SRAM型FPGA可靠性快速评估技术  

Fast reliability evaluation for SRAM-based spaceborne FPGAs

作　　者：赵磊[1] 王祖林[1] 周丽娜[1] 杨蓝[1] 

机构地区：[1]北京航空航天大学电子信息工程学院,北京100191

出　　处：《北京航空航天大学学报》2013年第7期863-868,共6页Journal of Beijing University of Aeronautics and Astronautics

摘　　要：空间辐射环境严重影响星载SRAM(Static Random Access Memory)型FPGA(Field Programmable Gate Array)的可靠性,提出了星载SRAM型FPGA可靠性快速验证评估方法.在传统故障注入验证的基础上,引入可靠性预评估技术,在逻辑门级分析单粒子翻转对FPGA配置信息位的影响,同时对TMR(Triple Modular Redundancy)冗余方式进行单粒子翻转关键位置评估.然后构成不同敏感级别的故障序列,最后根据应用需求选择不同故障序列进行故障注入从而有效快速评估系统可靠性.该方法与逐位翻转相比,能够在保证故障覆盖率的同时,有效地减少实验时间,提高实验效率.Static random access memory（ SRAM）-based field programmable gate arrays （FPGAs） relia- bility is seriously affected by space radiation. A new method for fast reliability evaluation of SRAM-based FP- GAs was proposed. Based on traditional fault injection technique, a pre-evaluation was introduced to analyze the effect of single event upsets （SEU） in logic gate-level and SEU sensitive bits in triple modular redundancy （TMR）. Then, the fault sequences of different sensitive level were formed. Finally, different fault sequences were selected depending on the application needs and injected into system for evaluating reliability. The meth- od can not only reduce the experiment times and improve the experiment efficiency but also ensure the fault coverage.

关 键 词：星载FPGA 故障注入 单粒子翻转 可靠性评估 

分 类 号：TP332.1[自动化与计算机技术—计算机系统结构]