迈克尔逊干涉仪测透明介质厚度及折射率  

The Refractive Index and Thickness of the Transparent Medium Measured by Michelson Interferometer

作　　者：万伟[1] 

机构地区：[1]西南科技大学,四川绵阳621010

出　　处：《大学物理实验》2013年第5期22-24,共3页Physical Experiment of College

基　　金：西南科技大学校级2013年度实验技术研究项目(13syjs-32)

摘　　要：提出了使用用迈克尔逊干涉仪,改变光源入射方式及观测方式以获得稳定、清晰等厚干涉现象的方法。探究了在光路中插入的被测透明介质如何对等厚干涉条纹产生影响,并导出了被测介质厚度、折射率及旋转角度与等厚干涉条纹移动量之间的关系。实现对透明介质厚度、折射率进行简练、快速的同时测量。This paper advances the methods of obtaining steady and clear equal thickness interference phenomena by applying Michelson interferometer, changing the incident manner of light source and observation manner. It explores how the measured transparent medium that is put in the light path influences equal thickness interference fringes and deduces the relationships between the measured medium thickness, refractive index or rotation angle and the moving amount of equal thickness interference fringes. The transparent medium thickness and refractive index can be simultaneously measured quickly.

关 键 词：迈克尔逊干涉仪 光程差 等厚干涉 折射率 透明介质 

分 类 号：O4-34[理学—物理]