微带器件双端口测试的校准件设计  

Calibration Standard Design Based on the Microstrip Dual-Port Test

作　　者：李秀萍[1,2] 任正[1,2] 李南[1,2] 

机构地区：[1]北京邮电大学电子工程学院,北京100876 [2]东南大学毫米波国家重点实验室,南京210096

出　　处：《北京邮电大学学报》2013年第5期1-5,共5页Journal of Beijing University of Posts and Telecommunications

基　　金：国家自然科学基金项目(61072009);毫米波国家重点实验室项目(K201209);中央高校基本科研业务费专项项目

摘　　要：通过校准修正矢量网络分析仪全部12项系统误差,利用Matlab程序实现了SOLT(short、open、load、through)和TRL(through、reflect、line)校准算法,去除误差项,得到真实的S参数.通过与矢网校准结果相对比验证了算法和程序的正确性,并在此基础上制作了SOLT和TRL微带结构校准件,并成功用于滤波器测试.Short, open, load, through （SOLT） and through, reflect, line （TRL） calibration techniques were described. The 12-term system errors for two-port calibration were shown, and the actual S-parame- ters device was derived from the measured S-parameters by using matlab programs. Comparison between the matlab programs results and the vector network analyzer measurement data validated the correctness of the calibration approaches and procedures. The SOLT and TRL microstrip calibration standards were de- signed for microstrip filter measurement

关 键 词：校准件 系统误差 校准算法 S参数测量 

分 类 号：TN702[电子电信—电路与系统]