红外焦平面器件微扫描技术的发展  

Development of Microscan Techniques in Infrared Focal Plane Array

作　　者：王忆锋[1] 侯辉 冯雪艳[3] 

机构地区：[1]昆明物理研究所,云南昆明650223 [2]总参陆航部驻成都地区军事代表室,四川成都610036 [3]中国兵器工业集团公司科技部,北京100821

出　　处：《红外技术》2013年第12期751-758,共8页Infrared Technology

摘　　要：红外焦平面器件的像元由光敏区和非光敏区(亦称为死区)构成。死区对应的场景成为探测盲区,落在死区上的场景光子属于无效光子,对信号没有贡献。利用微扫描动作将死区光子转移到光敏区,可以提高红外成像系统的空间分辨率。基于有关基本概念,介绍了红外成像系统中微扫描技术的原理、实现方法和发展趋势。A pixel of infrared focal plane array （FPA） is composed of active area and inactive area that is also called dead space. The scene region corresponding to dead space is blind spot for detection, and scene photons incident on dead space is invalid which has no contribution to signal. The spatial resolution of infrared imaging system can be enhanced by transferring the photons of dead space to active area with microscan actions. Based on related basic concepts, the principles, realization methods and development trends of microscan techniques in infrared imaging system were presented.

关 键 词：微扫描 空间分辨率 焦平面列阵 红外成像系统 

分 类 号：TN215[电子电信—物理电子学]