波导检波装置的失效模式及改善措施  

The Failure Mode of Waveguide Detector Device and Improvements

作　　者：孔占兴[1] 

机构地区：[1]中国空空导弹研究院,河南洛阳471009

出　　处：《电子与封装》2013年第12期23-25,29,共4页Electronics & Packaging

摘　　要：文中报告了波导检波装置应用过程中主要存在的三种失效模式现状:常温下检波电压幅值发生跳变,在某频点跳变量达到120 mV;高低常三温下检波电压幅值变化率超过25%;在高低常三温下检波电压幅值不满足250～900 mV幅值范围的要求。对这三种失效模式进行了研究,主要从检波二极管、检波盒体对检波性能的影响展开了具体的讨论。文中重点论述了检波二极管的功率容量饱和特性、检波二极管的温度特性,推导出检波电压幅值温度变化率公式;同时还分析了高、低温情况下由于检波腔体尺寸的微小变化使得谐振状态改变从而对产品高、低温下检波电压幅值变化的影响。最后,依据失效模式的机理分析给出了产品的改善措施。This paper summarized the three main issues, occurring in the application process of waveguide detector device： At room temperature, detection voltage amplitude occurred jump, and the jump variables achieved 120 mV in a frequency; in all temperatures, detector voltage amplitude variation surpassed 25%; detection voltage amplitude did not satisfy the requirement of the amplitude range. Mechanism analysis was carried out for the three failure modes, and the detector diode, detector cassette was discussed on detector performance. The detector diode saturation characteristics of the power capacity and the detector diode temperature characteristics was discussed, and the temperature change rate of the detected voltage amplitude was derived. The affect of amplitude variation of detection voltage was analyzed. The resonant state was changed by small changesof cavity size. Finally, the product improvement measures was gived according to the mechanism of failure mode analysis.

关 键 词：检波装置 检波电压幅值 幅值变化率 

分 类 号：TN814[电子电信—信息与通信工程]