对紧缩系统可靠性试验的商榷  

Discussion on Condensed System Reliability Test

作　　者：丁定浩[1] 

机构地区：[1]中国电子科学研究院,北京100041

出　　处：《电子产品可靠性与环境试验》2013年第6期1-4,共4页Electronic Product Reliability and Environmental Testing

摘　　要：阐述了紧缩系统可靠性试验的局限性,论证了在确定紧缩系统可靠性考核指标中存在某种使用待考核可靠性预计参数作为考核标准的矛盾性(问题),并用数值示例说明紧缩系统可靠性鉴定试验存在附加风险。The limitations of condensed system reliability tests are presented. There are some problems when using the tested reliability prediction parameters as the assessment indicators for condensed system reliability. The additional risks for condensed system qualification tests are illustrated with a numerical example.

关 键 词：紧缩系统 紧缩比例 可靠性鉴定试验 考核指标 

分 类 号：V216[航空宇航科学与技术—航空宇航推进理论与工程]