基于后驱动技术的BIT测试适配器  

BIT Test Adapter Based on Back Driving Technology

作　　者：张天宏[1] 李旋君 辛季龄[1] 

机构地区：[1]南京航空航天大学动力工程系,江苏南京210016

出　　处：《计算机自动测量与控制》2000年第6期37-38,47,共3页Computer Automated Measurement & Control

摘　　要：介绍一种采用后驱动技术的故障注入方法 ,可以在不拆卸被测系统任何部件也不需在被测系统中添加任何测试接口的情况下 ,对被测系统实施方便灵活的故障注入。文章首先简单介绍了智能化BIT测试适配器 ,接着重点阐述了后驱动技术的原理、后驱动故障注入的实现及后驱动故障注入的特点。Back driving technology is used to realize the fault injection function in this paper, which has the advantages of removing no components of the unit in test and with no extra test interface. After a short description of an intelligent BIT test adapter, the paper mainly discusses the principle of back driving, back driving technology in fault injection and the feature of back driving based fault injection.

关 键 词：数字电路 在线测试 后驱动 BIF测试适配器 

分 类 号：TN790.7[电子电信—电路与系统]