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作 者:杨玲[1] 韦帅[1] 张婷婷[1] 许积文[1] 王华[1]
机构地区:[1]桂林电子科技大学材料科学与工程学院,桂林541004
出 处:《材料导报》2013年第24期30-33,共4页Materials Reports
基 金:广西信息材料重点实验室研究基金(桂科能0710908-05-Z)
摘 要:摘要以乙酰丙酮锌、乙酰丙酮铝为锌和铝的原料,乙醇和水为溶剂,采用超声喷雾热解法在玻璃衬底上制备了Zn0:Al透明导电薄膜,研究了Al添加量为O%~20%(原子分数,下同)对ZnO:Al薄膜光电性能的影响。使用XRD、SEM、DSC、FTIR、四探针、分光光度计对薄膜进行了表征和分析。结果表明,300℃的低温能生长出结晶态的薄膜,AI掺杂引起晶格常数减小;晶粒形貌为片状;随着AI添加量的增加,方块电阻先降低后增大,Al添加量为4.0%时具有最低的方块电阻(4.43kΩ/sq),最佳的电阻率(O.43Ω·cm);Al添加量对薄膜的透光率影响较小,平均可见光透光率大于80%。真空热处理可显著降低方块电阻,A1添加量为4.O%的薄膜经过550℃热处理后,其方块由.阻降低到106n/sa.相应的巾.阻率为1.0X10-2Ω·cm.Zn(acac)2 and Al(acac)a were used as sources of zinc and aluminum, and ethanol and water acted as solvent. The ZnO : A1 thin films were deposited on glass substrates by ultrasonic spray pyrolysis. The effect of alumi- num doping level (0%-20%) on optical and electrical properties of ZnO : Al thin films were studied. The ZnO : Al thin films were characterized by XRD, SEM, DSC, FTIR, fore-point probe and UV-Vis spectrophotometer. The re- sults show that polycrystalline ZnO : Al thin films can be grown at low temperature of 300 °C. The lattice constant decreases because of the aluminum doping. The shape of grain is flake-like. With increasing doping level, the sheet re- sistance decreases first and then increases. The smallest sheet resistance of 4. 43 kΩ/sq and the optimal resistivity of 0. 43 Ω· cm are obtained at doping level of 4. 0%. The aluminum doping has a little influence on the visible transmit- tance, and the average visible transmittance exceeds 80%. Vacuum annealing can significantly reduce the sheet resis- tance, and the optimal sheet resistance of 106 Ω/sq (resistivity of 1. OX10-2Ω) · cm) can be achieved at doping level of 4.0% and annealing temperature of 550 ~C.
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