红外焦平面阵列非线性校正曲线测量方法  

Method for measuring nonlinear calibrated curve of infrared focal plane arrays

作　　者：王飞[1] 戢运峰[1] 冯刚[1] 徐作冬[1] 邵碧波[1] 

机构地区：[1]西北核技术研究所激光与物质相互作用国家重点实验室,陕西西安710024

出　　处：《中国光学》2014年第1期144-149,共6页Chinese Optics

基　　金：激光与物质相互作用国家重点实验室创新基金资助项目(No.SKL111102)

摘　　要：针对红外焦平面阵列强度响应的非线性失真现象,本文提出了一种基于单波长激光器测定红外焦平面阵列非线性校正曲线的方法,设计出用于测量的实验装置,并通过实验研究获得了实测的非线性校正曲线。结果表明,该方法规避了红外焦平面阵列光谱响应不均匀性的影响,满足了装置器件在工程技术中通用性和实用性的需要,在简单易行的同时保证了较高的测量精度。As for the nonlinear effects of infrared focal plane arrays intensity response, a nonlinear calibration method is proposed based on single wavelength laser. Experimental equipment is designed for measuring, and the nonlinear calibration curve of the focal plane array is obtained through the measuring equiprment. Experi- mental results show that this method aviods the influence of infrared focal plane arrays spectral response non- uniformity, and meets the requirement of generality and practicability of the device in the engineering technology, which ensures the high accuracy of measurement as well as simpleness.

关 键 词：红外焦平面阵列 非线性 校正 

分 类 号：TN215[电子电信—物理电子学]