GSXC-Ⅱ型平面光栅衍射效率测试仪  

The Model GSXC-Ⅱ Measurement Instrument for the Diffraction Efficiency of Plane Gratings

作　　者：龚健[1] 沈德洪[1] 林中[1] 赵均定 贺锦奎 

机构地区：[1]浙江大学 [2]上海物理光学仪器厂

出　　处：《光学仪器》1991年第5期17-22,共6页Optical Instruments

摘　　要：本文提出了一种可用于紫外、可见至近红外光波长区平面光栅衍射效率自动测试的智能化测试仪器。文中叙述了该仪器的测量原理、仪器结构、光学系统和微机接口及电子线路的基本原理,并结出了十几种典型光栅的实测曲线。实测结果表明该仪器的测量重复性优于1.5％,均方根误差小于0.5％。An instrument controlled by a microcomputer has been presented which was used in automatical measurement of the diffraction efficiency of a ultroviolet/visible or near-infrared plane gratings,In this paper,the principle of the instrument operation, construction, optical system, interface unit and electronic system have been introduced. Some diffraction efficiency curves of typical gratings have been presented. When one grating was measured by two instruments repeatedly,respectively, the result shows that the measurement repeatability of two instruments was all better than 1.5％, and the rms error is less than 0.5％。

关 键 词：平面光栅 衍射 效率 测试仪 

分 类 号：TH741.6[机械工程—光学工程]