基于亚像素边缘检测的PCR芯片参数测量系统  

Parameter Measurement System of PCR Chip Based on Sub-pixel Edge Detection

作　　者：刘勇[1] 王卫华[1] 李志刚[1] 张文[1] 夏营威[1] 孙淼[1] 张龙[1] 

机构地区：[1]中国科学院安徽光学精密机械研究所,安徽合肥230031

出　　处：《仪表技术与传感器》2014年第2期65-67,89,共4页Instrument Technique and Sensor

摘　　要：针对PCR芯片几何参数的高精度测量需求,设计了基于亚像素边缘检测的PCR芯片参数测量系统。该系统以机器视觉系统为硬件平台,首先采用LOG算子对采集图像进行像素级初定位,通过Hough变换获得图像边缘方向;然后建立坐标系模型,利用灰度插值法获取新的亚像素边缘点;最后在亚像素边缘方向上进行高斯拟合精确定位。试验结果表明:该系统边缘定位精度高,且具有方向不变性,能够满足PCR芯片的检测要求。Aimed at high-precision measurement requirement of the PCR chip, a measurement system based on machine vision with sub-pixel edge detection was designed. LOG operator was used to locate image on the level of pixel. Hough transform and gray interpolation come in handy to achieve image edges in the coordinate system model and sub-pixel points of the edge. Experimental results show that this system has rotational invariance and realizes edge precise detection to satisfy measurement of the PCR chip.

关 键 词：机器视觉 PCR芯片 边缘检测 亚像素 高斯拟合 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]