MOCVD derived double-sided YBa_2Cu_3O_(7-δ) films on Y_2O_3 /YSZ/CeO_2 buffered textured metal substrates  

作　　者：XIONG Jie ZHANG Fei XIA YuDong LIU Xin ZHAO RuiPeng ZHAO XiaoHui TAO BoWan 

机构地区：[1]State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China

出　　处：《Science China(Technological Sciences)》2014年第4期720-724,共5页中国科学（技术科学英文版）

基　　金：supported by the National Natural Science Foundation of China(Grant No.51002024);Sichuan Youth Science and Technology Innovation Research Team Funding(Grant No.2011JTD0006);Fundamental Research Funds for the Central Universities(Grant Nos.ZYGX2012J039 and ZYGX2011Z002)

摘　　要：We have successfully employed metal-organic chemical vapor deposition （MOCVD） technique to simultaneously deposit double-sided YBa2Cu3O7-δ （YBCO） films on both sides of YzO3/yttria-stabilized zirconia （YSZ）/CeO2 （YYC） buffered biaxially textured Ni-5 at.% W substrates, which is of great prospect to cut the production cost of YBCO coated conductors. X-ray diffraction analysis revealed that both sides of YBCO film were purely c-axis oriented and highly textured. The co-scan of （005） YBCO and Ф-scan of （103） YBCO yielded full width at half maximum （FWHM） values of 4.9° and 6.6° for one side of double-sided YBCO film, respectively, as well as 4.4° and 6.4° for the other side. The current transportation measurements performed on such double-sided 500 nm-thickness YBCO films showed the self-field critical current density （Jc） at 77 K of 0.6 MA/cm^2 and 1.2 MA/cm^2, respectively. Further research is in the process of exploring new solution to improve the Jc in practice.

关 键 词：MOCVD double-sided YBCO JC 

分 类 号：TN304.055[电子电信—物理电子学]