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机构地区:[1]中国兵器工业计算机应用技术研究所,北京100089 [2]北京航空航天大学可靠性与系统工程学院,北京100191
出 处:《现代电子技术》2014年第9期138-141,144,共5页Modern Electronics Technique
基 金:国家自然科学基金项目(61201028;61376042)
摘 要:瞬变电压抑制器(TVS)的浪涌寿命是TVS使用方最为关注的可靠性指标。在对TVS浪涌寿命特点及其主要影响因素分析的基础上,根据Arrehenius模型原理建立了TVS浪涌寿命与脉冲峰值电流倍数和环境温度这两个主要影响因素的关系模型,基于加速浪涌寿命试验数据确定了该模型中待定系数的取值。鉴于TVS使用条件可能与试验条件不同,采取调整系数的办法对模型进行完善,通过理论计算给出非试验波形调整系数的计算公式,通过试验数据和MIL-HDBK-217F中TVS失效率模型调整系数给出了质量调整系数和环境调整系数。试验数据表明建立的TVS浪涌寿命模型比较客观地反映了TVS的浪涌寿命与主要使用因素的关系。Surge life of TVS(transient voltage suppressor)is a reliability index concerned by TVS users most. On the basis of analyzing TVS surge life characteristics and its primary influence factors,a relation model of TVS surge life with pulse peak current multiple and environment temperature was established according to the Arrehenius model principle. The values of unde-termined coefficients of the model were determined according to TVS surge life test data. Because practical working conditions of TVS may be different with the test conditions,the model was perfected with the method of using adjusting coefficients. The cal-culating formula of the adjusting coefficients of non-test transient waveforms was given by theoretical calculations,and the quality grades and environments adjusting coefficients were given according to the test data and adjusting coefficients of TVS failure rate model in MIL-HDBK-217F. The test result show that the surge life model can objectively reflect the relationship between TVS surge life and its influence factors in use.
分 类 号:TN306.34[电子电信—物理电子学] TN31
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