钙钛矿型铁电薄膜疲劳性能研究进展  

Research Progress on the Fatigue Properties of Perovskite Ferroelectric Thin Films

作　　者：刘海峰[1] 徐永利[1] 田莳[1] 

机构地区：[1]北京航空航天大学材料科学与工程系,北京100083

出　　处：《材料工程》2000年第9期44-46,共3页Journal of Materials Engineering

摘　　要：钙钛矿型铁电薄膜由于在非易失存储器方面的应用而受到广泛研究 ,但疲劳问题是影响其应用的主要障碍。简要综述了近年来国外在钙钛矿型铁电薄膜疲劳机制和消除疲劳措施等方面的研究进展。Perovskite ferroelectric thin films have been extensively studied because of their applications in nonvolatile memories. However, the fatigue problem is the main hindrance to their applications. In this paper, the recent progresses on the fatigue mechanisms and the methods to mitigate fatigue of perovskite ferroelectric thin films are reviewed briefly.

关 键 词：钙钛矿型 PZT铁电薄膜 铁电材料 疲劳性能 

分 类 号：TM223[一般工业技术—材料科学与工程]