一种BIST测试激励的聚类移位压缩方法  

Rotation-based Test Pattern Clustering Compression Method for BIST

作　　者：涂吉[1] 王子龙[1] 李立健[1] 

机构地区：[1]中国科学院自动化研究所,北京100190

出　　处：《计算机科学》2014年第5期33-36,共4页Computer Science

基　　金：国家自然科学基金项目(61073035)资助

摘　　要：提出一种针对内建自测试的测试激励聚类移位压缩方法。对难测故障的测试向量进行聚类压缩,将测试向量划分为若干类,每类内的向量相互之间最多只有一比特相异,从每类中只选取一个种子向量存储到ROM中。为了进一步提高测试向量压缩率,对聚类后的种子向量再进行移位压缩。实验结果表明,聚类移位压缩具有较高的测试数据压缩率,能减少难测向量存储单元,且能以芯片频率进行测试。This paper presented a novel test pattern compression scheme for deterministic BIST.To reduce the storage requirements for the deterministic patterns,it relies on a two-dimensional compression scheme,which combines the clustering compression and rotation-based compression.Clustering compression divides the rest random pattern resistant faults（RPRF） into several clusters in a circuit.The test patterns in each cluster are no more than one bit different from each other,and only one seed selected from each cluster is needed to be stored in ROM.In order to reduce more storage cells,rotation-based compression method is added to compress the seeds of clustering compression.Experimental resnlts show that the proposed scheme requires less test data storage than some previously published schemes,and it has the ability of at-speed test.

关 键 词：聚类压缩 移位压缩 内建自测试 测试激励 

分 类 号：TP306.2[自动化与计算机技术—计算机系统结构]