光模块加速寿命试验最佳测试温度的确定方法  

Determination the Optimum Test Temperature of Accelerated Life Test for Optical Module

作　　者：顾益双 舒勤[1] 姜振超[2] 黄宏光[1] 

机构地区：[1]四川大学电气信息学院,成都610065 [2]四川电力科学研究院,成都610065

出　　处：《半导体光电》2014年第3期406-410,共5页Semiconductor Optoelectronics

基　　金：四川省科技支撑计划项目(2011GZ0004);四川省电力公司科技项目(11H0920)

摘　　要：为了确定小型可热插拔式(SFP)光模块寿命试验所需的最短时间,提出了基于加速因子最大化的最佳测试温度的确定方法。首先,利用阿伦尼斯模型证明了温度的选择不会改变寿命预测结果,并讨论了加速因子取极大值的条件。然后利用步进温度实验获得的驱动电流随测试温度变化的曲线给出了最佳测试温度的确定方法。最后,计算分析表明由于驱动电流受温度的影响,在最佳测试温度下进行光模块寿命试验仍然很困难。In order to determine the minimum time required for aging test of the small formfactor pluggable（SFP）optical module,a method to determine the optimum testing temperature based on maximizing acceleration factor is proposed.Firstly,it is proved that the life prediction results cannot be modified by temperature selection through the Arrhenius model,and the conditions for maximizing acceleration factor are discussed.Then,the method of determining the optimum temperature is deduced through the driving current-testing temperature curve from the stepping temperature experiment.Lastly,the calculation and analysis results show that the driving current is affected by temperature,which makes it difficult to conduct optical model aging test under the optimum testing temperature.

关 键 词：小型可热拔插式光模块 加速因子 阿伦尼斯模型 驱动电流-温度曲线 最佳测试温度 

分 类 号：TN606[电子电信—电路与系统]