A color phase shift profilometry for the fabric defect detection  

作　　者：宋丽梅 李宗艳 常玉兰 邢广鑫 王朋强 习江涛 朱腾达 

机构地区：[1]Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University [2]School of Electrical, Computer and Telecommunications Engineering, University of Wollongong

出　　处：《Optoelectronics Letters》2014年第4期308-312,共5页光电子快报（英文版）

基　　金：supported by the National Natural Science Foundation of China(Nos.60808020 and 61078041);the Tianjin Research Program of Application Foundation and Advanced Technology(No.10JCYBJC07200)

摘　　要：For fabric defect identification in the textile industry, a three-dimensional(3D) color phase shift profilometry(CPSP) method is proposed. The detecting system is mainly composed of one CCD camera and one digital-light-processing(DLP) projector. Before detection, the system should be calibrated to make sure the camera parameters. The CPSP color grating is projected to the measured fabric by DLP projector, and then it is collected by CCD camera to obtain the grating phase. The 3D measurement can be completed by the grating phase difference. In image acquisition, only invariable grating is projected to the object. In order to eliminate the interference from background light during the image acquisition, the brightness correction method is researched for improving the detection accuracy. The experimental results show that the false rate of detecting the fabric defects is 5.78%, the correct rates of detecting the fabric defects of hole and qualified fabric are both 100%, and the correct rates of detecting the fabric defect of scratch and fold are 98% and 96%, respectively. The experiment proves that the proposed method can accurately identify fabric defects.For fabric defect identification in the textile industry, a three-dimensional （3D） color phase shift profilometry （CPSP） method is proposed. The detecting system is mainly composed of one CCD camera and one digital-light-processing （DLP） projector. Before detection, the system should be calibrated to make sure the camera parameters. The CPSP color grating is projected to the measured fabric by DLP projector, and then it is collected by CCD camera to obtain the grating phase. The 3D measurement can be completed by the grating phase difference. In image acquisition, only invariable grating is projected to the object. In order to eliminate the interference from background light during the image acquisition, the brightness correction method is researched for improving the detection accuracy. The experi- mental results show that the false rate of detecting the fabric defects is 5.78%, the correct rates of detecting the fabric defects of hole and qualified fabric are both 100%, and the correct rates of detecting the fabric defect of scratch and fold are 98% and 96%, respectively. The experiment proves that the proposed method can accurately identify fabric defects.

关 键 词：织物疵点 疵点检测 轮廓 相移 DLP投影机 CCD摄像机 彩色 检测系统 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术] TS103.63[自动化与计算机技术—计算机科学与技术]