玻璃基片和石英试杆对磁光薄膜居里温度测量的影响及其消除方法  

Methods of Eliminating the Magnetization of the Holder and Glass in Determining Curie Temperatures of Magneto-optic Recording Films

作　　者：李震[1] 邱进军[1] 朱全庆[1] 胡用时[1] 

机构地区：[1]华中科技大学电子科学与技术系,湖北武汉430074

出　　处：《磁性材料及器件》2001年第1期60-62,共3页Journal of Magnetic Materials and Devices

摘　　要：在磁光薄膜居里温度的测量中 ,当薄膜的磁化强度信号与石英试杆和玻璃基片的磁化强度信号具有同一数量级时 ,石英试杆和玻璃基片对薄膜居里温度的确定引入了很大的误差。提出了消除石英试杆和玻璃基片影响的三种方法。实验结果表明 ,由三种方法消除石英试杆和玻璃基片影响后所确定得到的磁光薄膜居里温度相对偏差小于 5%。因此 。If the saturation magnetization of magneto-optical thin film is in the same order of quantity as the magnetization of quartzose holder and glass substrate, the magnetization of the holder and glass causes high error in determining Curie temperature of thin film. Three methods of eliminating the magnetization of the holder and glass are presented. The experiment shows that the relative error of values of Curie temperature determined by the three methods is less than 5%,and proves the three mathods to be practical for eliminating the influence of holders and glass substrate.

关 键 词：石英试杆 玻璃基片 居里温度测量 磁光薄膜 

分 类 号：TH811[机械工程—仪器科学与技术]