HL-1装置放电坪区小破裂现象分析  

ANALYSES OF MINOR DISRUPTIONS DURING CURRENT FLAT PHASE IN THE HL-1 DEVICE

作　　者：严龙文[1] 石秉仁[1] 郑永真[1] 彭利林[1] 黄克强[1] 

机构地区：[1]核工业西南物理研究院

出　　处：《核聚变与等离子体物理》1991年第1期9-15,共7页Nuclear Fusion and Plasma Physics

摘　　要：HL-1装置上观测到大量放电破裂现象,其中一类出现在电流坪段的小破裂现象,在文献上讨论很少,其产生时的安全因子是2.5≤q_a≤4.5,密度为1×10^(13)cm^(-3)≤n<3×10^(13)cm^(-3)或n≥4×10^(13)cm^(-3), 在环压及软X射线上观测到几百毫秒的驰豫振荡。本文详细分析了这类现象的性质及特征,并讨论了其产生的原因。The phenomena of minor disruptions during current flat phase have been observed in the HL-1 device for five years. When these phenomena appear the safety factors are 2.5≤qa≤4.5,and densities are 1 × 1013cm-3≤ n≤3×1013cm-3 or n≥4× 10I3cm-3. Periodic relaxation ocsillations of voltage and soft-X-rays are observed during minor disruptions. In the present paper, we carefully analyse their character and development conditions.

关 键 词：HL-1装置 放电坪区 破裂 弛豫振荡 

分 类 号：TL631.24[核科学技术—核技术及应用]