虚拟仪器在存储元件记忆特性测试中的应用  

The application of virtual instrument in memory characteristic testing of storage component

作　　者：俞承芳[1] 虞惠华[1] 汤庭鳌[1] 

机构地区：[1]复旦大学电子工程系,上海200433

出　　处：《半导体技术》2001年第4期53-56,共4页Semiconductor Technology

基　　金：863项目国家自然科学基金项目(69876008)资助

摘　　要：论述了虚拟仪器在存储元件测量中的应用；介绍了采用虚拟仪器测试存储元件记忆特性的方法，并指出虚拟仪器的功能在基本硬件确定之后，可通过软件编程来实现，因而具有很大的灵活性，在对程序稍作修改后能适用于不同存储器件的测试。The application of virtual instrument (VI) in memory component testing is described in this paper. The general transistor testing instrument can't be used to test its storage characteristic because the memorization performance of memory component requires it can be read out repeatedly after once writing into storage component. This paper focuses on the methodology of utilizing VI to test memorization characteristic of storage component. It is very flexible to realize the VI functions by software programming when the basic hardware is fixed. So, the VI tester can be used for different storage components so long as doing some software modification.

关 键 词：存储元件 虚拟仪器 控制面板 记忆特性测试 程序设计 

分 类 号：TP216[自动化与计算机技术—检测技术与自动化装置]