任意层介质光栅耦合器耦合特性微扰法分析  

The Perturbation Analysis For The Coupling Characteristics of Grating Couplers With Multilayer Dielectric

作　　者：潘松[1] 王启丽[1] T Tamir 张蜀章 

机构地区：[1]杭州电子工业学院 [2]纽约理工大学

出　　处：《杭州电子工业学院学报》1994年第4期35-42,共8页Journal of Hangzhou Institute of Electronic Engineering

摘　　要：本文基于微扰理论，给出了研究多层介质光栅耦合特性的近似方法，并用此法对具有矩形与三角形剖面的平面介质光栅的耦合参数随光栅厚度tg的变化作了计算．结果表明，在实用范围内．与用严格方法得到的结果吻合良好．In this paper, an approximate approach based on perturbation theory was developed for the analysis of the coupling characteristics of planar grating with. multilayer dielectric.of gratings having rectangular or blazed triangular profile method. And these results are in good agreemen with published dats by using rigorous analysis in the interesting area.

关 键 词：光栅耦合器 耦合特性 微扰法 光栅 

分 类 号：TN622[电子电信—电路与系统]