便携式X射线荧光分析仪的研制与应用  

A Portable X-Ray Fluorescence Spectrometer Using Si PIN Detector and Its Applications

作　　者：陈永君[1] 邓赛文[1] 马天芳[1] 李蓉华[1] 梁国立[1] 詹秀春[1] 

机构地区：[1]国家地质实验测试中心,北京100037

出　　处：《岩矿测试》2001年第2期136-141,共6页Rock and Mineral Analysis

基　　金：科技部仪器改造研究项目 !(JG98- 9)

摘　　要：采用Si-PIN高分辨率探测器 ,研制了 2 4 0 8道X射线荧光分析仪 ,其体积小、重量轻、携带方便。能量分辨率为 2 0 3eV/MnKα ;稳定性为 5% ( 8h) ;配备了专门的、操作简便的软件系统。在地质和矿物样品分析中进行了应用 ,与封闭正比计数器X射线荧光分析仪相比 。A high resolution (203 eV/Mn K α ) portable X ray fluorescence spectrometer with 241 Am as X ray excitation source and Si PIN as detector has been developed. A high performance application software with functions of automatic data acquisition, qualitative and quantitative analysis has been incorporated into the system. The instrument is small in size, light in weight, and portable. The long term stability of the system is satisfactory with a variation of 5% in 8 h. The detection limits of this system for most elements are one order of magnitude lower than the system with sealed proportional counter. Analytical applications of this system in rock and mineral analysis are also given.

关 键 词：SI-PIN探测器 分辨率 X射线荧光光谱法 同位素 技术指标 

分 类 号：TG115.225[金属学及工艺—物理冶金] O657.34[金属学及工艺—金属学]