镍电极材料层错结构的X射线衍射分析  

X-RAY ANALYSIS OF STACKING FAULTS IN STRUCTURE OF NICKEL ELECTRODE MATERIALS

作　　者：王超群[1] 王宁[1] 刑政良[1] 吕光烈[1] 胡广勇[1] 

机构地区：[1]北京有色金属研究总院,北京100088

出　　处：《有色金属》2001年第2期83-86,共4页Nonferrous Metals

基　　金：国家自然科学基金资助项目 (5 9872 0 0 6)

摘　　要：β -Ni(OH) 2 的X射线衍射谱的基本特征是衍射线的选择宽化 ,它与晶粒内部的微结构特性如微晶尺寸参数和层错缺陷结构等有关。通过镍电极材料的全谱X射线分析区分这些微结构特性、测定层错概率 。Ni(OH) 2 is an important positive electrode of Ni/MH and Ni/Cd secondary alkaline batteries The fundamental feature in X ray diffraction pattern of β Ni(OH) 2 powder is an isotropic broadening of some diffraction lines and it is closely related to the microstructure character in the particles Based on the whole patterns X ray diffraction analysis,the relationship between the presence of such peculiarity in X ray diffraction patterns and the stacking faults has been established,and applied to estimate the amount of defects The stacking faults in the electrode materials result in the good electrochemical behavior The line broadening of X ray diffraction is an important structural parameter

关 键 词：镍电极 层错结构 X射线衍射分析 碱性电池 

分 类 号：TM912.2[电气工程—电力电子与电力传动]