硅加速度计动态I/O特性的标定和数据采集  

Standarding and Data Acquisition on Dynamic I/O Characteristic Curve of Silicon Accelerometer

作　　者：刘理天[1] 温明生[2] 吴徽[1] 李英慧[2] 

机构地区：[1]清华大学微电子学研究所,北京100084 [2]吉首大学传感器研究所,湖南吉首416000

出　　处：《吉首大学学报》2000年第4期36-40,共5页

基　　金：国家计委重点科技攻关项目! (97- 76 0 - 0 3- 0 2 )

摘　　要：介绍了振动台测量控制系统、标定振动g值及减小标定误差的技术 .在此基础上 ,介绍了利用HP344 0 1A型数字万用表和微型计算机进行数据采集的通信技巧和编程技巧 .利用这套系统 ,对笔者联合研制开发的仪表级压阻式硅加速度计动态I/O特性进行了大量的测试标定和数据采集处理 ,得出了可靠和满意的结果 .In this paper,we have introduced a measuring and controlling system of vibrometer;standardizing technology on g value of vibrometer and introduced especially technology to reduce the standardizing errors.On the basis,we have introduced communication and programming technique in this data acquisition with model HP34401A digital multimeter and computer.By utilizing this system ,we standardize and collect many I/O characteristic curve for instrument grade piezoresistive silicon accelerometer jointly developed by ourselves. We have obtained satisfyingly reliable results.

关 键 词：振动台测量控制系统 动态I/O特性 标定 数据采集 硅加速度计 振动测量 

分 类 号：TH824.4[机械工程—仪器科学与技术]