线性模拟集成电路故障测试与诊断:短路导纳参数法  

Fault Detection for Linear Analog IC: The Method of Short Circuit Admittance Parameters

作　　者：李锋[1] 商慧亮[1] 孔庆生[1] 

机构地区：[1]复旦大学电子工程系,上海200433

出　　处：《应用科学学报》2001年第3期228-232,共5页Journal of Applied Sciences

摘　　要：提出一种线性模拟集成电路故障测试与诊断方法 :短路导纳参数法 .该方法只要对电路外部端口进行两次电压测试即可判断该电路是正常的还是有故障的 ;用此方法可以设计出电路自动测试装置 ,应用于线性模拟集成电路生产线的自动测试或供维修人员判定电子设备中线性模拟集成电路是否有故障 .其突出优点是对元件参数容差和测试、计算误差有抑制能力 .A fault detection method, i.e, the method of short-circuit admittance parameters, for linear analog IC is proposed in this paper. Only two time voltage measurements at the ports of the circuit are suggested to decide whether the circuit is working normally. This method can be used to design a circuit automatic detecting equipment for technicians to decide whether there is any fault in the linear analog circuits. The attractive merits of this method are the component parameter tolerance and the error reduction in measurement and calculation.

关 键 词：模拟集成电路 故障测试 短路导纳参数 故障诊断 电压测试 元件参数 

分 类 号：TN431.1[电子电信—微电子学与固体电子学] TN407