利用轫致辐射能谱测定高频腔体电压  

Measurement of RF cavity voltage with X-ray energy spectrum

作　　者：俞鸣峰[1] 高宜海[1] 张生虎[1] 郑启文[1] 郁奇[1] 郭应祥[1] 雷祥国[1] 

机构地区：[1]中国科学院近代物理研究所,兰州730000

出　　处：《核技术》2001年第8期696-700,共5页Nuclear Techniques

摘　　要：报道了利用轫致辐射能谱测定高频腔体电压的原理、方法及结果分析 ,并与直接测量法的结果进行比较 ,说明这种间接测定法的优点。通过实际调束对束流轨道、能量的测定与计算验证了用能谱法测定腔体电压数值的准确可靠性。This paper introduced the principle, method and results of the RF cavity high voltage measurement by using X-ray energy spectrum, and explained its advantages by comparing with RF voltage direct measurement method. Through practical operations, the accuracy and reliability of the energy spectrum measurement method was proved.

关 键 词：高频电场 轫致辐射 连续能谱 能量最大值 光电效应 半导体探测器 电压测量 重离子加速器 高频腔体 

分 类 号：TL56[核科学技术—核技术及应用] TL506