一个集成电路可测性设计辅助软件——ASIC2000TA  

A CAD Software for IC Testability Measurement ——ASIC2000TA

作　　者：杨军[1] 时龙兴[1] 胡晨[1] 许舸夫[1] 王佩宁 

机构地区：[1]东南大学电子工程系,南京210096

出　　处：《电子器件》2001年第3期194-198,共5页Chinese Journal of Electron Devices

摘　　要：随着集成电路工艺复杂性和规模复杂度的提高 ,芯片测试变得越来越困难 ,而可测性设计可以用来简化测试 ,降低测试成本。但是可测性设计将加大设计的难度 ,必须通过可测性设计自动化来降低其难度 ,我们在九五国家攻关计划的支持下完成了一个集成电路可测性设计的辅助软件—— AISC2 0 0 0 TA,通过大量的实例分析证明该软件具有一定的实用性。With the more complexity in technology and the scale for IC, the measurement of the chip becomes more difficulties. However, the testability design could be used to simplify the measurement and reduce the cost. Also the testability design could increase the difficulty in the a body design. The difficulty could be solved by using design automation. we have completed the CAD software-ASIC2000TA on the support of national project. A great quantity of experimental examples show that the software could be used in pratice.

关 键 词：集成电路 可测性设计 ASIC2000TA软件 

分 类 号：TN402[电子电信—微电子学与固体电子学] TP317[自动化与计算机技术—计算机软件与理论]