用二相双列线阵CCD器件实时采集衍射图样  

Collecting Diffraction Patterns with Two-phase Double-rows Linear Array CCD Apparatus

作　　者：陈飞明[1] 曹万民[1] 韩苏雷[1] 杨会霞[2] 

机构地区：[1]洛阳工学院数理系,河南洛阳471039 [2]中国一拖集团有限公司,河南洛阳471004

出　　处：《洛阳工学院学报》2001年第3期83-85,共3页Journal of Luoyang Institute of Technology

摘　　要：采用二相双列线阵CCD器件 ,配以CCD专用采集卡 ,对He -Ne激光经双缝所生成的夫琅和费衍射图样进行了实时采集与测量。介绍了该方法的结构原理、实验装置和测量要求。通过将测量值与理论值比较 ,发现采用微机测量双缝衍射光强分布规律不仅速度快 。Using a two phase double rows linear array CCD apparatus,along with a special collecting card,Frauhofer diffraction patterns formed by He Ne laser through double seams were collected and measured.This paper presented the principle,the experiment device and the measuring requirement.This method has the advantage of high accuracy and speed.

关 键 词：CCD器件 光强度测量 实时采集 衍射图 双缝衍射 

分 类 号：O436.1[机械工程—光学工程] TN386.5[理学—光学]