机内测试技术发展趋势分析  

The Development Trend Analysis of the Built-in Test Technology

作　　者：徐永成[1] 温熙森[1] 易晓山[1] 刘冠军[1] 

机构地区：[1]国防科技大学机电工程与自动化学院,湖南长沙410073

出　　处：《测控技术》2001年第8期1-4,共4页Measurement & Control Technology

摘　　要：近 2 0年来 ,机内测试 (BIT ,Built InTest)技术从理论到应用取得了显著进展 ,已成为提高复杂系统测试性、维修性的有效途径 ,并大量应用于大型军用装备、航空航天系统当中 ,应用范围正进一步扩展到民用大型复杂设备。本文从BIT与ATE的日渐融合、机电BIT发展方向、BIT发展为集状态监控、故障诊断、控制决策于一体的综合系统、智能理论与技术在BIT中的应用等 4个方面详细分析了BIT理论与技术的发展趋势 。During the recent twenty years, the built in test technology has gone ahead greatly from theories to applications and become an effective approach of improving testability and maintainability of complex system.Its application range from large military equipment to aeronautics and space system and extend to the civil large complex equipment.The paper analyzes the development trend of the BIT technology according to the interfuse of BIT and ATE,application domain extending to electromechanical system,BIT becoming to an integrated system combined with condition monitoring,fault diagnosis,control and decision making, intelligent theory and technology has application in BIT.The research of this paper has reference value for BIT in depth study of relevant field especially the military industry.

关 键 词：机内测试 故障诊断 自动测试设备 智能理论 航空电子系统 

分 类 号：V243[航空宇航科学与技术—飞行器设计] TN06[电子电信—物理电子学]