多元素样品背散射分析的解谱程序  

A computer program of backscattering analysis for multi-element samples

作　　者：李文治[1] 王宇[1] 崔福斋[1] 李恒德[1] 

机构地区：[1]清华大学

出　　处：《核技术》1989年第2期99-104,共6页Nuclear Techniques

基　　金：国家自然科学基金

摘　　要：本文介绍了一个根据RBS实验谱计算多元素样品表面层原子浓度的程序。讨论了计算模型的特征、程序的功能和应用范围。计算中,将被分析样品表示成一系列等厚的小薄层,从表面开始逐层计算。因此,可以很容易地得到多元素样品内的浓度-深度分布轮廓。本程序用BASIC语言编制并可在IBM微机上运行。操作时实现人机对话。现已有几个规范程序可供使用。这些规范程序既简单又可信。A computer program to calculate atomic concentrations in the surface layer of multi-element solids from experimental RBS spectra is presented. The basic features of the computational model, its function and application scope are discussed in detail. The analysed sample is modeled as a series of layers each with the same thickness and the calculations proceed layer by layer from the surface, so that the concentration and the depth profile of each element can be obtained. The program is in BASIC and it is operated on the IBM microcomputer in the manner of man-computer conversation. A. few of simple but quite reliable routines are available.

关 键 词：背散射分析 浓度深度分布 程序设计 

分 类 号：TP319[自动化与计算机技术—计算机软件与理论]