模拟低空环境下FPGA的SEU测试系统结果分析  

Analysis on Test Result for SEU of FPGA in Simulated Low-Altitude Environment

作　　者：顾泽凌 孟令军[1] 任楷飞 GU Ze-ling;MEMG Ling-jun;REN Kai-fei(National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China)

机构地区：[1]中北大学电子测试技术国防科技重点实验室,太原030051

出　　处：《电光与控制》2019年第1期73-76,共4页Electronics Optics & Control

基　　金：航空科学基金(20128067003)

摘　　要：为了探究在低空环境下SRAM型FPGA产生单粒子翻转事件与大气中高能粒子剂量的关系,设计了一种便携式测试系统。使用该系统在某地6个不同海拔的测试点对SRAM型FPGA进行单粒子翻转测试。某地平均海拔在3000～5000 m,可以很好地模拟低空飞行环境。通过测试试验,该系统获得了大量现场数据,使用Matlab对测试数据进行了分析。结合在某地的测试结果,从SRAM型FPGA的存储结构、单粒子翻转产生机理、测试系统的工作原理等方面入手,对该测试系统的科学性与实用性进行了验证分析。分析结果表明,该便携式测试系统科学有效,可为航空航天领域中SRAM型FPGA的选型与使用提供一种参考方式。A portable test system was designed in order to investigate the relationship between the SingleEvent-Upset( SEU) affairs of SRAM-based FPGAs and the dose of high-energy particle in low-altitude environment. By using the test system SEU tests of SRAM-based FPGAs were conducted at six different altitude sites in a certain area. The average elevation of the area is from 3000 m to 5000 m which is appropriate for simulation of low-altitude flight environment. In the tests the system gained lots of field datawhich was then analyzed by using Matlab. According to the test result the scientificity and practicability of this test system were verified and analyzed from such aspects as the storage structure of the SRAM-based FPGA the SEU generating mechanism and the working principle of the test system. The analysis result shows that the portable test system is effective which can serve as a reference for the selection and application of SRAM-based FPGAs in the aerospace field.

关 键 词：低空环境 SRAM型FPGA 单粒子翻转 测试系统 结果分析 

分 类 号：V11[航空宇航科学与技术—人机与环境工程]