不同上升时间快前沿电磁脉冲引起PN结失效、烧毁的二维数值模拟  

Two-Dimensional Numerical Simulation Lapse and Burnout for PN Junction Dev ice under EMP with Different rapid-rise Time

作　　者：郭红霞[1] 周辉[1] 陈雨生[1] 张义门[1] 龚仁喜[2] 关颖[2] 韩福斌[2] 龚建成[2] 

机构地区：[1]西北核技术研究所 [2]西安电子科技大学

出　　处：《微电子学与计算机》2002年第3期17-20,共4页Microelectronics & Computer

摘　　要：利用半导体器件二维模拟软件数值模拟计算了不同上升时间的快前沿电磁脉冲对PN结的毁坏过程,对计算结果作了分析,得到了一维器件模拟无法得到的电流通道等其他二维效应,详细地给出了器件正常工作、失效直至烧毁的全过程。By using of the program of two -dimensional device s imulation,we have simulated the behavior of PN j unction device that is under E MP with different rapi d -rise time and analyzed the results.The effects such as two -dimensional current pas-sage are given which could not be provided by one -dimensional device simulation.The whole process during which the device i s under working,lapse and burnout is described in detail.

关 键 词：电磁脉冲 漂移扩散模型 结热二次击穿 PN结 失效 烧毁 电子元器件 二维数值模拟 

分 类 号：TN6[电子电信—电路与系统]